Used MITUTOYO SJ-400 #9409431 for sale

MITUTOYO SJ-400 Wafer Testing and Metrology Equipment is designed as an all-in-one solution for quality inspections of wafer-based components. The system features both AC and DC inspection capabilities, along with a contact-wafer inspecting unit. The DC machine uses non-contact scanning and utilizes a high-precision linear encoder and drive to capture profile data points individually, giving the user the ability to inspect detailed features and times. The AC tool provides a variety of optical components and fixtures to measure properties such as form, roughness, and texture. MITUTOYO SJ 400 wafer testing and metrology asset uses both image and motion technology to collect data from wafers. High-precision image processors enable automatic measurements, while quadruple linear table positioning ensures accurate data acquisition. A contact stylus probe controlled by a high-precision encoder scans the profile of the wafer for precise measurement of height, width, and pitch of bumps, ribs, and other features. The scanning data can also be used to determine surface textures and defects. SJ-400 also features automatic data entry, storage, and analysis. The integrated software provides metrics and graphical reports, allowing the user to easily identify trends and quantify variability. The model utilizes both graphic and numeric displays, with data trending and statistical analysis functions. In addition, SJ 400 can interface with third-party software for data conversion and analysis. MITUTOYO SJ-400 is a modular equipment that can be customized for a variety of applications. Options include a high-resolution microscope, a vision inspection unit, a laser interferometer, and other optical components. The high-precision and repeatability of the system make it an invaluable tool for wafer testing in the semiconductor and electronics industries. The unit is also ideal for medical and dental applications, as it enables precise and detailed inspections of a wide variety of components.