Used MITUTOYO SJ-401 #84570 for sale
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Surface roughness profilometer Includes: Granite base stand Cable 02ADD950 Input tool.
MITUTOYO SJ-401 wafer testing and metrology equipment is an advanced wafer inspection and measurement solution. It is capable of achieving best-in-class results at a fraction of the cost of more sophisticated metrology systems. The system uses an automated optical microscope and advanced image processing software to automate the analysis of wafers, starting from the visual inspection of wafer markings and moving further through electrical and optical characteristics of the wafer. In addition, SJ-401 measurement software provides analysis of critical-dimension geometry and reference-plane reproducibility, as well as automatic sorting of suspect packages. MITUTOYO SJ-401 combines high resolution (1.4μm, 10μm) and process speed (up to 3000 chips/sec.) with a wide range of features that make it one of the most advanced systems on the market. It is equipped with a powerful CCD camera with a wide range of adjustable parameters, allowing for precise inspection and measurement of wafers. The software can detect even the slightest defects, with a minimally detectable defect size of 200nm, providing significantly enhanced device yields. The unit is compatible with a variety of industry-standard formats, including JEDEC, DVM, and SPC measurements. It also supports rapid data transfer and built-in real-time displays. With its easy-to-use, user-friendly graphical interface, SJ-401 is ideal for use by a wide range of operators, from beginners to skilled technicians. In conclusion, MITUTOYO SJ-401 is an advanced and cost-effective solution for wafer inspection, measurement and analysis. It offers a wide range of features, easy-to-use user interface, and support for a variety of industry-standard formats, making it the perfect machine for both traditional and modern wafer metrology.
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