Used MITUTOYO SJ-401 #9267193 for sale

MITUTOYO SJ-401 is a state-of-the-art wafer testing and metrology equipment designed for precise measurement of electrical, physical, and optical properties of semiconductor wafers. The system offers high resolution imaging and precise measurement of wafers up to 200mm in size. With its advanced optical unit, SJ-401 is capable of detecting and measuring even the smallest feature sizes on a wafer. MITUTOYO SJ-401 comes equipped with a 360° rotatable camera, allowing users to get ultra-high resolution images of both planar and non-planar wafer surfaces. A built-in sample stage is controlled by a position monitoring machine, eliminating sample movement due to environmental changes. Furthermore, the unit is capable of fast scanning, allowing for quick and reliable property assessment of the wafer. SJ-401 is equipped with a powerful computer tool capable of providing highly accurate results. The asset is able to identify properties such as topography, reflectivity, and characteristics of surface roughness as well as defect analysis. This model is also capable of storing the measurement results in a database for further analysis. In addition to providing high-precision wafer testing and metrology, MITUTOYO SJ-401 is also compatible with a wide variety of accessories that allow for even greater efficiency. These can include interference working units, stage-mounted objectives, wafer vision systems, and various industrial robot manipulators. Overall, SJ-401 provides users with the ability to precisely and accurately detect and analyze a wide range of wafer properties. With its advanced optical equipment and powerful computer, the system offers high speed, ease of use, and unsurpassed precision when testing and metrologizing wafer surfaces.