Used MITUTOYO SJ-401 #9292736 for sale

MITUTOYO SJ-401
ID: 9292736
Surface roughness profilometer.
MITUTOYO SJ-401 is a high performance wafer testing and metrology equipment designed for fast, accurate, and automated quality control of semiconductor wafers. It is suited for use in fabrication and development laboratories, as well as research and wafer manufacturing. The system offers a comprehensive set of features for all aspects of waferprocessing, including mass testing, 3D measurement,distortion evaluation, and defect analysis. As a user, you can leverage the unit's powerful algorithms and intuitive user interface to automate the process of wafer quality analysis and ensure wafer compliance with international standards. SJ-401 has an optimized optical machine that provides enhanced 3D measurements. The tool can measure the height profile, distance between features, and also distinguish fine textures down to 1 µm. The asset includes a large, high-resolution camera that provides detailed imaging for further analysis of the collected data. The model also includes a wide range of automated tools, such as geometrical and distortion measurements. These automated tools enable users to quickly and accurately measure the geometrical properties of wafers as well as evaluate the wafer's distortion parameters. Additionally, the equipment can detect a variety of defects, like scratches, contamination, and cracks, which can help to identify the root cause of failure. To facilitate analysis and reporting, MITUTOYO SJ-401 also has software that can generate comprehensive reports on the results of tests and measurements. The software integrates with multilingual SPC/QC software, allowing for efficient quality management. This reduces the time and resources needed to analyze test results. In short, SJ-401 is a powerful, automated wafer testing and metrology system that enables users to quickly and accurately analyze the quality of semiconductor wafers. It offers various advanced features, including a high resolution camera, automated measurement tools, and multiprotocol reporting software. This makes MITUTOYO SJ-401 an ideal choice for quality control in wafer fabrication and development laboratories.
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