Used MITUTOYO SJ-401 #9308596 for sale

MITUTOYO SJ-401 is an advanced wafer testing and metrology equipment, developed by Japanese optical equipment manufacturer MITUTOYO. It provides highly accurate measurements of semiconductor wafers and other thin flat objects. The system uses a non-contact measuring head for both high precision and high speed wafer tests. It is ideal for testing production quality of wafers with thicknesses ranging from 0.3mm to 3.2mm for programs such as die size, yield management and process control. SJ-401 leverages a series of advanced 3D lasers to simultaneously measure up to 4 different sample points at once, which accelerates testing cycles significantly and reduces the cost of labor. MITUTOYO SJ-401 is designed for maximum accuracy, with a repeatability of 0.2 μm for measurements up to 20 μm. It is equipped with an advanced tracking unit and a high resolution CCD camera which can detect even the slightest changes in surface conditions. The machine also features auto-correction for sample-to-probe variations and an autofocus function to obtain consistently accurate results. SJ-401 comes with a user-friendly graphical interface with a touch panel display to guide the user through various different test setups and conditions. This enables operators of any experience level to quickly learn how to use the tool and to maintain it with ease. Ultimately, MITUTOYO SJ-401 is a powerful, reliable, and cost-effective wafer testing and metrology asset. Its integration of advanced laser and correction technology offers users a way to measure their wafer samples quickly and accurately for improved yields, helping them achieve maximum cost savings.