Used MITUTOYO SJ-402 #9227881 for sale

MITUTOYO SJ-402 Wafer Testing and Metrology Equipment provides accurate testing and measurement capabilities for a range of semiconductor test and measurements applications. The system utilizes an X-Y high-speed scanning microscope stage to provide imaging and measurement over a 4 inch wafer, and incorporates a low-vibration 1-axis z-table that facilitates 3D-leveling and AFMs measurements. Additionally, the unit includes an automated image processing and analysis interface, for rapid image-based analysis and measurement, as well as a robust set of automated testing and measurement peripherals. The machine's imaging and measurement capabilities provide an advanced architecture for high-accuracy image capture and analysis. This makes it suitable for microprobing and microstructural testing and analysis. The figure-of-merit measurement hardware is designed for accurate probing and measurement of electrical resistances, capacitance, and inductance. The tool also supports jitter and pulse-width analysis and other high-frequency parameters. SJ-402 asset provides powerful image processing and analyses features that are robustly optimized for accuracy and precision. The model's automated image processing and analysis interface leverages specialized algorithms for pattern recognition, feature extraction, robust-image segmentation, mask diagnostics, periodicity, precision alignment, and other functions to enable fractal metrology. The powerful image stabilization feature allows the equipment to account for background variations. The system includes a suite of automated testing and measurement peripherals to facilitate accurate and fast measurement of electrical parameters. Included in the unit are automated resistance testers, capacitance bridges, inductance analyzers, AC/DC high-resolution current meters, and precision levelers. These components enable accurate measurement of a variety of electrical parameters, and are designed to be used with automated test equipment and a range of electrical probes. The flexible machine software architecture enables both custom and parametric measurements to be made quickly and accurately. The tool includes a user-friendly visual interface for navigating image tools and data. The intuitive user interface allows for rapid set up and parameter tuning, and also helps in designing optimal systems for specific applications. Overall, MITUTOYO SJ-402 Wafer Testing and Metrology Asset provides a reliable and versatile platform for rapid testing and measurement of a wide range of materials and electrical components. This model is ideal for semiconductor test and measurement applications, providing accurate measurements of electrical parameters and precise imaging capabilities.