Used MITUTOYO SJ-411 #9267192 for sale

MITUTOYO SJ-411 is a powerful and capable wafer testing and metrology equipment. It is used to measure and inspect the structure, composition, and electrical characteristics of various types of semiconductor wafers. The system's primary feature is its ability to measure, evaluate, and analyze the features of a wide range of semiconductor wafers including single crystal, polycrystalline, ppep-etched, MEMS, CMOS, and FD-SOI. SJ-411 offers excellent performance in analyzing the various properties of a wafer such as composition, crystal structure, topography, electrical characteristics, etch rate, and current-voltage characteristics. MITUTOYO SJ-411 has a highly sensitive capacitive measuring head (CMH) that can measure the electrical properties of the wafer at up to a resolution of 1 nanometer. It is also equipped with a low-noise amplifier with a measurement dynamic range of up to 65 mV. This allows for the resolution and accuracy required for accurate measurements. Furthermore, the unit features a laser metrology package that is equipped with a microscope for high-accuracy surface topography measurements. This package can measure up to a resolution of 5 nanometers. SJ-411 also features an automated detection machine, which can detect lithographic patterns as small as 0.25 microns. This feature enables quick inspection of very fine structures on the wafer surface. Another notable feature of the tool is its advanced software package that allows for comprehensive analysis and inspection of the wafer structure. The software automatically analyzes and classifies various features on the wafer surface, enabling fast analysis of data. Overall, MITUTOYO SJ-411 is an advanced and reliable wafer testing and metrology asset. It can measure and analyze the structure, composition, and electrical properties of various types of semiconductor wafers with impressive accuracy and precision. Its advanced features facilitate quick and accurate inspection of wafers, enabling consistent quality control.