Used MITUTOYO YC-H250 #9227872 for sale

MITUTOYO YC-H250 is a high-accuracy testing and metrology equipment capable of accurately measuring wafers for semiconductor production. The system utilizes a low-drift scanning/profiling platform and a high-accuracy encoders to provide highly accurate measurements to micron tolerances in less than 1 second. The unit boasts a variety of integrated capabilities for wafer testing and metrology, such as dynamic focus control for automated optical adjustment of the focusing lens and modular wafer transport machine with smooth-motion operation. This energy-efficient tool also features LED Illumination or an optional flare compensation for high precision results. YC-H250 asset can also be upgraded with a variety of advanced options, including a multipoint true 3D measurement capability, multi-axis alignment with tilted image correction, and automated particle size analysis. Using a combination of user-friendly software with high-accuracy touch probes, the model is capable of fully automated production line testing and inspection with features such as automatic error compensation, OMEGA software, and DDM compatibility. The equipment also integrated with a range of fully supported components, such as operator guidance with instant error warnings, automatic operation calibration and diagnosis, and remote diagnostics and support. To ensure the highest accuracy measurement and performance, the system comes standard with a wide array of components, such as a polishing unit, built-in scales, tilt/circular wafer table, and integrated measuring systems for wafer analysis. MITUTOYO YC-H250 unit also features an intuitive graphical user interface that allows for easy set-up and operation of the machine, as well as convenient storage and data management. YC-H250 tool is a highly reliable and accurate testing and metrology solution for production and quality assurance of semiconductors. With its fast cycle times and upgrading capabilities, the asset provides the perfect combination of performance and value for organizations demanding faster and more accurate measurements for production line measurements.