Used MITUTOYO YC-H260 #9267188 for sale

MITUTOYO YC-H260 Wafer Testing & Metrology Equipment is an innovative tool for diagnostic testing and analysis of advanced IC (integrated circuit) materials. It is engineered to measure and inspect samples with utmost accuracy and repeatability. YC-H260 is a massive tool that contains two main components, the Optoscanner, and the ID fan system. The Optoscanner is composed of over one hundred advanced imaging units with an automated XY stage assembly. This allows it to measure and inspect processed wafers and bare silicon wafers with unparalleled precision. The IDfan unit consists of an array of optical heads and detectors that are used to obtain the maximum accuracy in the metrology of the semiconductor structure. This allows users to inspect even the smallest features, allowing them to detect defects that would otherwise not be detected by other methods. MITUTOYO YC-H260 also includes specialized software that allows users to quickly analyze results and obtain statistics quickly and accurately. This software includes statistical metrology packages, image analysis tools, label recognition, particle counting, and surface evaluation functions. This allows users to efficiently parse data, enabling them to quickly pinpoint problem areas and optimize the performance of their chips. Moreover, YC-H260 includes a variety of environmental input options which makes it easy to simulate a wide range of conditions. This enables users to test the performance and reliability of their components under a variety of environmental conditions, such as hot or cold temperatures. In addition, MITUTOYO YC-H260 features user-friendly operation by utilizing an intuitive touch screen interface that makes navigating menus and operating the machine easy. This allows even inexperienced users to quickly learn how to use the tool and get the most from their investment. All in all, YC-H260 Wafer Testing & Metrology Tool is an invaluable tool for diagnosing and improving semiconductor components. By featuring advanced imaging, repeatable accuracy, statistical analysis, and reliable environmental simulation, users have a practical tool for improving the performance and reliability of their components.