Used MITUTOYO YC-H260 #9292733 for sale

MITUTOYO YC-H260 is an integrated wafer testing and metrology equipment that enables the accurate data acquisition from the wafer surface with high precision. The system offers on-axis optical alignment, making it easy to use and precise measurements. With its integrated interferometers, YC-H260 can measure wafer warpage as well as surface flatness and other related parameters of the wafer. The unit is also capable of non-contact measurement of high aspect-ratio structures with a high degree of accuracy. The machine is equipped with two optical set-ups: a wide-view image sensor with windows for auto-alignment feature and a high-resolution image sensor. The wide-view image sensor is able to capture images of the wafer's surface and use it for coarse measurements. The high-resolution image sensor is capable of capturing detailed images in multiple stages, allowing measuring local surface parameters with a high level of precision. This can be important for adapting to different production needs such as the precise measuring of corners and slits. The tool is also designed to reduce non-productive time and improve production yield by providing automated operation and feedback. With the automated operation feature, a signal is sent for the wafer to move to the next measuring position without the need to adjust the set-up manually, reducing the risk of errors. The automated feedback offers real-time data capture as images are presented on the screen yielding quick results and reliable data collection. The asset incorporates several additional features for ease of use such as motorized and manual focusing, remote operation, bright LEDs, ergonomic design, multi-user support, and online teaching. By utilizing these features, users are able to gain faster results, accuracy, and confidence during their measuring. The intuitive, user-friendly software provides clear graphical user interface display for efficient access to measurement data with comprehensive measuring functions for every need. MITUTOYO YC-H260 is a high-end non-contact production tester and metrology model suitable for wafer inspection and form measurement. It is easy to setup and use its advanced features and is ideal for process validation and quality control.