Used MOT μGALV #293807037 for sale
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ID: 293807037
Vintage: 2023
Plating system
HMI
Filtering : 1 μm 10" Catridge
N2 Purge
Monitor, 17"
PLC Control
Valve: PP / EPDM Sealing
Template tank
Temperature: ±0.5 K
Heater: (2) Sensors
Circuit pump:
Capacity: 20 l/min
Power supply: 230 VAC
pH Control:
Accuracy: ±0.2 pH
Range: 2-12 pH
Rectifier:
Pulse reverse rectifier
Output: 0-20 ADC
Resolution: 1 mA
Output voltage: 0-10 V
Ripple: <1%
Minimum pulse time: 0.1 msec
Spray guns:
Material: PTFE
DI-Water Spray gun
N2 Spray gun
Wafer holder:
Material: PEEK
Edge exclusion: 3 mm
Chuck, 2"-6"
2023 vintage.
MOT μGALV is a cutting-edge wafer testing and metrology equipment designed to meet the demanding requirements of semiconductor manufacturing and research laboratories. This advanced system combines precision testing, measurement, and analysis capabilities to ensure the quality and reliability of wafers used in the production of integrated circuits and other electronic devices. At the heart of μGALV unit is its high-precision Galvanomagnetic measurement technology, which provides unparalleled accuracy and sensitivity in characterizing the electrical properties of semiconductor wafers. Utilizing the principles of the Hall effect, the machine is capable of measuring key parameters such as carrier concentration, mobility, resistivity, and Hall coefficient with exceptional precision and speed. One of the key features of MOT μGALV tool is its modular design, which allows for flexible configuration and scalability to suit the specific needs of different applications and industries. The asset can be equipped with a range of measurement probes, sensors, and accessories to accommodate various wafer sizes, types, and materials. Additionally, the model offers an integrated software platform that enables users to easily control and customize measurement routines, analyze data, and generate detailed reports. In addition to its Galvanomagnetic measurement capabilities, μGALV equipment also offers a range of other metrology techniques to provide comprehensive characterization of semiconductor wafers. These include optical inspection, surface profilometry, electrical testing, and defect analysis, allowing users to obtain a complete picture of the wafer's properties and quality. MOT μGALV system is equipped with advanced automation features to streamline the testing and measurement process, improve throughput, and reduce human error. The unit can be integrated with robotic handling systems, wafer mapping tools, and automated data analysis software to create a seamless and efficient workflow from wafer loading to final inspection. Furthermore, μGALV machine is designed with a focus on reliability, durability, and user-friendly operation. The tool features a robust construction, high-quality components, and advanced calibration and calibration capabilities to ensure accurate and consistent results over time. Additionally, the asset is equipped with intuitive user interfaces, interactive tutorials, and comprehensive technical support to help users get up to speed quickly and maximize the model's capabilities. In conclusion, MOT μGALV equipment sets a new standard for wafer testing and metrology with its advanced Galvanomagnetic measurement technology, comprehensive characterization capabilities, automation features, and user-friendly design. Whether used in semiconductor manufacturing, research and development, or quality control applications, μGALV system offers unmatched performance, flexibility, and reliability to meet the demanding requirements of the semiconductor industry.
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