Used MULTI SYSTEMS MM5000 #293604579 for sale

MULTI SYSTEMS MM5000
ID: 293604579
Vintage: 2001
Measuring system 2001 vintage.
MULTI SYSTEMS MM5000 is a powerful wafer testing and metrology system that features advanced features, such as a large aperture optical microscope with 4x to 50x magnification, and a range of specialized measurement functions. MM5000 uses a CMOS 300 image sensor to capture high-resolution images that are fully 16 bits in color, allowing for detailed analysis of small structures and details. In addition, MULTI SYSTEMS MM5000 is equipped with 20 high intensity LEDs for illuminating samples from different angles and depths. MM5000 is designed to measure a variety of materials, sizes and shapes of samples, including substrates, wafers, dies, and integrated circuits. Additionally, the system is capable of measuring planarity, form, surface area, and volume. It also offers the ability to analyze complex geometries and detect subtle defects, such as process variations, in precision-manufactured parts. MULTI SYSTEMS MM5000 is easy to integrate and use with existing systems, such as design automation software and other production line tools. Its control unit features an intuitive graphical user interface (GUI) and automated processes to streamline testing. Data can be transferred via a USB or RS232 connection; the on-board software complies with industry standards so it can be used with compatible equipment and software. MM5000 offers a range of accuracy specifications, with a resolution of 0.1µm and sample repeatability of ±0.5µm. It also features an optical bench that is free of vibration and temperature drift, so results remain stable over time. The bench is constructed from high-grade aluminum which helps maintain a stable environment, and it also has an in-built system to counteract the expansion and contraction of the optics due to thermal changes. In addition, MULTI SYSTEMS MM5000 is designed for ease-of- cleaning, with a dust proof door that allows for fast, efficient cleaning. It is designed for use in demanding wafer measurement applications and its superior metrology makes it the ideal choice for ensuring the perfect production of optimal quality parts.
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