Used N&K 1280 #293649644 for sale

N&K 1280 wafer testing and metrology equipment is a versatile, high-precision wafer testing and metrology platform, capable of characterizing critical wafer parameters, such as structure, surface roughness, impurities, and so on. It uses an array of advanced analytical techniques such as spectroscopy, scattering, SEM imaging, and others. 1280 employs a highly precise 10-axis automated system, capable of scanning and testing even very small wafers. Its precision resolution is up to 0.3nm and it can test samples up to 300mm (12") in dimension. Its software is intuitive and user-friendly, enabling researchers to quickly and accurately test a variety of wafers. N&K 1280's spectroscopic capabilities are powerful, offering a variety of atomic and molecular spectroscopies. These spectroscopic methods make it possible to measure the presence and level of different atomic and molecular elements on the surface of the wafer. This can be very useful for characterizing the wafer's intrinsic physical properties such as its mass, electronic structure and other features. 1280 also provides a SEM imaging feature that allows for an even more detailed model of the wafer surface. This technique can be used to image the morphology of the wafer during the manufacturing process and to determine the most suitable treatment procedures for optimizing the performance of a given product. In addition, N&K 1280 unit offers a wide range of other metrology techniques such as image spectroscopy, X-ray diffraction, X-ray fluorescence and infrared spectroscopy. These techniques make it possible to measure the electrical and optical properties of a wafer and to pinpoint physical defects or weaknesses that could be compromising its performance. Finally, 1280 provides additional features such as an in-line wafer measuring machine. This tool allows for automated testing of wafers as they are being processed, quickly and accurately determining if a manufactured product is within acceptable tolerances. To sum up, N&K 1280 is a powerful and versatile wafer testing and metrology platform, offering a comprehensive suite of analytical techniques and metrology tools. It provides plenty of useful features to scientists, allowing them to accurately analyze wafer properties, efficiently test manufactured products and pinpoint potential flaws.