Used N&K 1712-RT #9299902 for sale

N&K 1712-RT wafer testing and metrology system is an advanced, high-throughput, automated metrology platform used for the characterization of wafers and other semiconductor substrates. It offers powerful measurements of physical, electrical and optical parameters, along with a broad range of characterization options, including vibrational, structural, chemical and thermal analyses. 1712-RT is designed to provide fast and repeatable measurements of the device structure, material properties, temperature effects, electrical characteristics, optical properties, and dielectric properties of wafers and other substrates. It also offers non-contact defect inspection and defect analysis to ensure process compliance. It features a highly precise, automatic sample feeder that handles a wide variety of wafers and other substrates, and has the ability to incorporate inspection and analysis processes in one station. N&K 1712-RT has a range of measurement capabilities, including advanced metrology for critical dimension and step height measurements, optical micrography, chemical composition analysis and stress mapping. It also enables three-dimensional measurements and cross-sectional imaging. Additionally, it features advanced signal processing and data analysis software which allows fast and accurate profiling of the device structures, as well as contouring and profile slicing. 1712-RT provides accurate and repeatable measurements with one test station. Its real-time data capture, visualization and analysis capabilities enable it to report and analyze die-to-die variability, thus allowing engineers to track and control ongoing production processes. The system can be used for failure analysis and root cause investigation for the most complex materials, structures and processes. Its advanced automation software provides an automated workflow, which simplifies the setup and operation while enhancing operator safety. It is also capable of handling a wide range of parameter settings, making it a versatile and flexible solution for routine and research-based measurements. Its wide range of features and capabilities make it the perfect tool to meet the demanding requirements of wafer testing and metrology.