Used N&K 1712-RT #9312850 for sale

N&K 1712-RT is a state-of-the-art wafer testing and metrology equipment designed for fast, accurate, and non-destructive testing of wafer materials. It features a variety of modules and scanning techniques, including atomic force microscopy (AFM) and optical interferometry (IF), to measure a variety of parameters, including strain, stress, defect density, defect localization, deposition thickness, and wave front. By analyzing this data, users can develop an accurate picture of the wafer's performance and any potential reliability issues that could cause failure. 1712-RT is a comprehensive system capable of operating across multiple regions, with multiple die size capacities in one unit. It offers the ability to quickly switch between different scan parameters and sample types. The machine can test both thin wafer samples and thick-wafer samples with minimal sample preparation. The tool effectively measures a variety of parameters from the edge to the backside of the wafer with a non-destructive approach. N&K 1712-RT has an intuitive graphical user interface to adjust settings and store results. It features an advanced statistical analysis suite that allows users to view results in multiple forms. Additionally, the asset offers a variety of connectivity options that make remote monitoring and perform data analysis across multiple data sets possible. The model has improved throughput, accuracy, and repeatability. It utilizes both large area and precision AFM scanning techniques to examine the topography of the wafer samples and measure a variety of parameters from the surface. This helps establish a more comprehensive view of the wafer's performance, helping customers select the best performing wafer materials for their applications. 1712-RT features top-of-the-line optics, scanning platforms, and components. It utilizes high-resolution cameras and proprietary scanning algorithms to quickly and accurately detect defects and other anomalies on the wafer surface. The equipment also has the capacity to store and analyze large data sets, allowing users to study a variety of parameters both historically and in real-time. N&K 1712-RT is a reliable, high-quality testing and metrology system for wafer materials. It has the capabilities to take fast and accurate measurements, store data sets, analyze results in multiple forms, and detect defects and other issues on the wafer surface. Its accuracy, repeatability, and throughput are top-notch, making it an excellent choice for those needing reliable results that meet their stringent requirements.