Used N&K 3300 #9378632 for sale

N&K 3300 Wafer Testing and Metrology Equipment is a high-performance machine that can quickly and accurately measure electrical properties of wafers. It features a combination of hardware components, software, and a range of sensors to create an effective end-to-end testing solution. The core of the system is a miniaturized laser beam scanner and dual force sensors that measure the magnitude and direction of forces on the surface of the wafer. This allows the unit to quickly capture the characteristics of the electrical properties and generate a detailed report on the wafer's performance. The machine is equipped with a range of software tools designed to improve the accuracy and speed of the testing process. The software allows operators to monitor device performance, calibrate data measurement, and automate routine tasks. The software also includes a range of algorithms and analytics that make it easier for operators to identify problem areas or trends in the wafer's performance. To help operators make informed decisions, the tool also contains an integrated data analysis suite that includes powerful tools for analyzing data, such as scatter graphs and performance meters. It also has the ability to generate reports on the performance of individual wafers. This helps operators quickly identify any issues and make the necessary adjustments. Finally, the asset is also equipped with a range of safety features to protect operators from radiation, dust, and other hazards while working with wafers. The machine also incorporates a number of advanced features, such as an acoustic vibration sensor, which ensures the safety of all involved. Overall, 3300 wafer testing and metrology model is an immensely powerful and efficient automated equipment that is designed to help operators measure and monitor the performance of wafers quickly and accurately. The system is built with a combination of advanced hardware and software that ensures maximum accuracy and reliability. This makes the unit ideal for those who need to measure wafer performance for a variety of applications.