Used N&K Gemini #9228094 for sale

N&K Gemini is a powerful wafer testing and metrology equipment designed to enable quick and accurate analysis of semiconductor wafers and to help ensure the highest quality standards in wafer fabrication. With integrated high-precision, real-time imaging techniques, Gemini offers comprehensive data analysis within nanometer-scale resolutions. One of the major features of the system is its false coloring technique, which allows for the flexibly visual representation of certain integrated circuit features like electrical continuity, local topography, and mask alignment. With enhanced lighting and imaging capabilities, users can easily and quickly identify and analyze any malformations or imperfections in the semiconductor wafer. In addition to its false coloring capabilities, N&K Gemini supports a variety of automated tools to analyze and profile wafer features, such as dimensional and surface roughness measurement, micromirror measurements, auto feature recognition, and defect inspections. These automated functions can help save time and ensure reliable measurements and data accuracy. Sonoresistivity measurements, failure analysis in defect inspections, isolation and cluster analysis are also available. Furthermore, the unit's optical metrology capabilities include multi-sensor scanning and profile analysis, allowing users to analyze complex features and 3D topography of the wafer in nanometer-level resolution. Gemini offers powerful data processing capabilities, allowing users to gain a deeper understanding of individual wafer features and the relationship between them. With its intuitive graphical user interface, users can easily create custom analysis and reporting tools, while its wide range of wafer analysis, metrology, and inspection software and components allow users to customize the machine to their particular needs. Overall, N&K Gemini provides a comprehensive and reliable wafer testing and metrology tool that makes it easy to identify and analyze any defects or imperfections in a semiconductor wafer with nanometer-level resolution. With its advanced imaging and automated data analysis capabilities, the asset helps ensure the highest possible quality standards in wafer fabrication.