Used NANOMETRICS Atlas II+ #293636675 for sale

NANOMETRICS Atlas II+ is a wafer testing and metrology tool that utilizes advanced optics and electronics to measure semiconductor wafer properties such as surface topography, oxide thickness, and resistivity. With the capability to inspect and analyze up to 8 inch wafers, this system is in demand for device development and advanced process control. The system is comprised of a state-of-the-art metrology platform, which includes an automated x-y scanner, an imaging microscope, and high-performance laser sensors. The x-y scanner allows for precise positioning of the wafer on the microscope stage and the accurate alignment of the measuring head. A range of imaging objectives enables the user to obtain images of different levels of detail on the wafer. The advanced laser sensing technology measures membrane and film thickness, as well as topographical details on the wafer that may not be visible to the naked eye. All measurements are acquired in microns and stored as digital data points. This helps to facilitate rapid evaluation of parameters such as oxide thickness, critical dimension, and resistivity. The software accompanying Atlas II+ displays images, data plots, and metrology process controls. It also includes automatic focusing algorithms to streamline the measurement process and minimize operator error. The system opens up a world of possibilities in wafer testing and metrology. With NANOMETRICS Atlas II+, device developers can quickly identify problems and make corrections quickly, reducing production time and cost. Advanced process control capabilities help to make sure mass production runs are compliant with specification requirements.