Used NANOMETRICS Atlas XP #9228091 for sale

NANOMETRICS Atlas XP is a comprehensive wafer testing and metrology equipment capable of performing fast, accurate, and reliable measurements on a wide range of semiconductor wafers. The system is suitable for all types of wafer probing, from device characterization and testing to fault isolation, reliability assessment, and yield enhancement. The unit incorporates a range of features that help streamline and automate wafer testing, including a built-in auto-correcting software, automated sample handling, high resolution laser mapping, and integrated metrology and thermal management capabilities. NANOMETRICS ATLAS-XP's wafer test machine is comprised of three main components: the Control Station, the Test Station, and the Metrology Station. The Control Station enables automated sample handling, computer control of sample preparation, sample qualification, and data acquisition to increase throughput and accuracy, while the Test Station enables automated parallel device testing of up to 200 devices per minute. Finally, the Metrology Station provides non-contact, high resolution laser mapping to facilitate quality assessment of individual devices and to monitor the process to ensure consistency and yield. The tool also provides a range of features to allow for rigorous data analysis, including high resolution imaging, rapid thermal cycling, and built-in integrated metrology. A wide range of parameters can be monitored and analyzed to help optimize performance and maintain a consistently high level of product quality. Furthermore, Atlas XP is capable of detecting fine physical structures, such as line widths and deposition thicknesses, that would otherwise be undetectable. The asset is designed to be used in conjunction with a variety of testing units and software packages, including both general purpose and specialized wafer test packages. It is compatible with a wide array of industry standard platforms and can be integrated with other equipment, such as thermal chambers, metrology systems, and process monitoring systems. Overall, ATLAS-XP is an advanced, integrated, and automated wafer testing and metrology model capable of providing reliable results for a variety of wafer probing tasks. The equipment has been designed with the user in mind, offering features that enable fast, efficient, and reliable sample probing, while also offering sophisticated data analysis capabilities to facilitate informed decisions.