Used NANOMETRICS Atlas #9244873 for sale

NANOMETRICS Atlas is a wafer testing and metrology equipment that provides enhanced throughput for dimensional and topographical measurements. The system is built upon structural positioning technology that is non-contact and supports a variety of sample shapes and materials. The unit utilizes multiple sensor technologies including capacitive, inductive, and optical sensors. The combination of these technologies is utilized to acquire precise 3D surface measurements in just a few seconds with nanometer (nm) accuracy. The machine's accuracy is enhanced by an automated, non-contact sample handling tool that allows quick setup and repeatable measurements. This asset also provides additional benefits such as high throughputs and measurement results that correlate with the actual manufacturing process, be it dry or wet etching, shadow masks, or photolithography. Accurate results are achieved by advanced edge detection algorithms that are able to detect and numerically display 3-dimensional shape features, even along curved surfaces. Atlas platform is versatile and can be configured to meet a great variety of requirements. It is equipped with a stepper motor for traversing stages, a motorized Z-axis for wafer/sample positioning, an adjustable focal distance, user-defined imaging parameters, and other customizable components. Additionally, the model includes a rapid stage traverse equipment to increase sample speed. Process Tracking Analytics (PTA) can be used to monitor and optimize production processes. PTA enables automatic measurement and analysis of dimensional and geometrical measurements and patterns over short or extended period of time. This feature is a valuable resource for process monitoring and process yield enhancement. Overall, NANOMETRICS Atlas is an effective wafer testing and metrology system that can help researchers and manufacturers to achieve precise results. The combination of multiple sensors, automated non-contact sample handling, rapid stage traverse, and advanced edge detection algorithms allow this unit to provide an accurate and efficient wafer testing experience. Additionally, PTA helps to monitor and optimize production processes helping improve the overall wafer quality and yields.