Used NANOMETRICS Atlas #9244875 for sale

ID: 9244875
Wafer Size: 12"
Vintage: 2005
OCD Metrology system, 12" 2005 vintage.
NANOMETRICS Atlas is a top of the line wafer testing and metrology equipment developed for semiconductor device manufacturers and material analysis laboratories. Atlas is designed to be used for measuring and verifying line geometries, surface topology, and material properties of wafer products. The instrument utilizes advanced imaging techniques and scanning electron microscopy (SEM) to generate high-precision three-dimensional image maps and other imaging-based forms of data. NANOMETRICS Atlas is capable of precise metrology and wafer testing measurements for a wide range of wafer products. By capturing detailed images of the wafer's features, Atlas enables verification and analysis of features as small as <50nm OPC, line widths and spacings, Vdd/Vss line optical imaging, metal thickness, and surface roughness. Additional features of the system are the ability to measure electrical properties such as resistance, capacitance and dielectric constant. NANOMETRICS Atlas is capable of handling up to 24 wafers at a time, in any pattern size up to 976cm2, and down to a minimum line width of 0.2µm. It comes with an integrated, automated wafer mapping unit and sophisticated defect analysis software to ensure the highest level of measurements accuracy and feature detection. The machine's user-friendly interface also gives users greater control of image capturing and sample processing settings. Atlas provides a comprehensive and cost-effective solution for high-precision wafer testing and metrology. With its ability to capture detailed images of a wide range of wafer products, NANOMETRICS Atlas ensures accurate and reliable measurements for critical applications in the semiconductor industry.
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