Used NANOMETRICS Atlas #9249580 for sale

NANOMETRICS Atlas
ID: 9249580
Wafer Size: 12"
Vintage: 2009
OCD Metrology system, 12" 2009 vintage.
NANOMETRICS Atlas is an automated, advanced wafer testing and metrology equipment used for high-accuracy electrical measurements. It provides highly precise measurements of electrical parameters and wafer surface properties. The system provides electrical measurements and surface analysis of wafers in a wide range of industries, including semiconductor, photovoltaic (PV), and MEMS. The unit features an integrated sample management machine for automated handling of wafers and sample loading/unloading. It also has a programmable temperature controller for reliable measurements over all temperature ranges up to 1,500°C. The tool allows for a wide range of electrical measurements, including: resistance, current, voltage, capacitance, inductance, charge, and power. It also features automatic parameter detection and optimization based on device characteristics. The asset also includes a built-in measurement event detection model for monitoring wafer parameters during fabrication processes. Atlas also features surface characterization capabilities, such as optical microscopy, atomic force microscopy (AFM), and scanning electron microscopy (SEM). Toscanner, an integrated scanning electron microscope, can be used to obtain detailed images of the surface and subsurface of the wafer. This helps identify contaminants, defects, and other abnormalities which can adversely affect device performance. The equipment is designed for flexibility and accuracy. It includes a comprehensive control panel that allows users to adjust parameters and settings for precise measurements. It also features a library of standard test and metrology applications, as well as user-programmable applications. This allows users to customize the system to fit their specific requirements. NANOMETRICS Atlas unit is designed to provide highly accurate measurements of wafer electrical properties and surface characteristics. It is used in a wide variety of industries, such as semiconductor, photovoltaic, and MEMS, for research, test, and manufacturing purposes. Its integrated sample handling machine, comprehensive control panel, and libraries of standard and user-programmable applications make it a flexible and useful tool for metrology and wafer testing.
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