Used NANOMETRICS Atlas #9270884 for sale

NANOMETRICS Atlas is a wafer testing and metrology equipment designed for the measurement and characterization of semiconductor materials and devices. It consists of a state-of-the-art software platform, a sub-nanometric scanning microscope, and a variety of sophisticated measurement and characterization components. The software provides the user with an easy-to-use GUI (Graphical User Interface) to control the system parameters, navigate the sample under inspection, develop workflows and visualize collected data. The platform enables users to measure anything from topography to electrical properties at any arbitrary resolution, both 2D and 3D. It supports a range of standard analysis tools such as image processing, line profiling, and advanced feature recognition allowing it to perform a variety of measurements and characterizations. The microscope used in Atlas has a scanning range of up to 150 mm, a lateral resolution of 0.11 µm, and an accuracy of up to 8 nm. It features a patented E-SEM (Energy Enhanced Scanning Electron Microscope) design, which allows users to capture both topographical and electrical images. The microscope is optimized for high precision scanning and feature recognition. NANOMETRICS Atlas can characterize a variety of materials at different stages of processing. It takes into account the various parameters that might affect the outcome, such as the material's electrical conductivity, its electrical capacitance, leakage current, and other parameters. It also offers a comprehensive set of sensors and probes including optical stress sensors and scanning ellipsometry probes. All the collected measurements and characterizations are stored on the unit and can be displayed in various formats, including table, graph, and histogram. In addition, the machine can display more advanced measurements such as topographical and electrical images, both 2D and 3D. Overall, Atlas provides an easy-to-use platform to measure and characterize a variety of semiconductor materials at different stages of processing. It utilizes its sophisticated software, advanced scanning microscope, and wide range of sensors and probes, which enable the user to gather the necessary information for further analysis. The collected data can then be displayed in clear graphical formats, helping users to gain deep insight into their component designs.