Used NANOMETRICS Atlas #9271266 for sale

NANOMETRICS Atlas is a revolutionary new wafer testing and metrology equipment that is designed to directly measure the quality of semiconductor wafers. It allows for automated image acquisition and analysis through the usage of a unique and innovative array of advanced imaging hardware and proprietary algorithms. The system is designed to quickly and accurately analyze wafer material integrity and wafer homogeneity across the entire wafer surface. It utilizes sophisticated imaging technology and advanced metrology techniques to capture detailed images and map the properties of the wafer material for an in-depth understanding of wafer quality. Atlas provides automated imaging and measurements of defect size, shape, location, and connectivity across the entire wafer surface. The software then processes the images to extract important data that can be used for process control and process optimization. NANOMETRICS Atlas also features a high-resolution 3D line-scanning capability for detailed metrology of wafers down to 0.1µm. This allows for greater depth of analysis and detailed investigation of the properties of the wafer material. The 3D line scanning capability also allows for the mapping of surface topography and fringes on wafers. Atlas unit integrates multiple topography technologies and offers advanced data analysis features for quickly determining variations in the patterning of the patterned layers on the wafers. This allows process engineers to quickly and accurately identify and analyze process variations in the production of semiconductor components. NANOMETRICS Atlas also offers advanced automated data analysis capabilities that allow users to quickly identify and analyze defect distributions across the wafer surface. This provides detailed insights into wafer quality and production process capabilities. In conclusion, Atlas is a powerful advanced wafer testing and metrology machine. It offers advanced imaging, metrology, and data analysis capabilities for comprehensive wafer quality testing. It is designed to provide detailed information on the quality of wafers and the production process through quick and accurate image analysis and defect mapping.