Used NANOMETRICS / BIO-RAD / ACCENT CDS 200 #293600166 for sale

ID: 293600166
Critical Dimension Scanning Electron Microscope (CD-SEM).
NANOMETRICS / BIO-RAD / ACCENT CDS 200 is a wafer testing and metrology equipment designed for production and research applications in semiconductor manufacturing. It offers both CD-SEM (Critical Dimension Scanning Electrical Microscopy) and CD-AFM (Critical Dimension Atomic Force Microscopy) capabilities in one system. It is capable of providing extremely high resolution, repeatable measurements on all types of semiconductor materials. ACCENT CDS 200 unit is configured to work with Windows 10 Professional x64, or Windows 7 Professional x64 operatings systems and is supplied with software that has customizable user settings, allowing it to be quickly adapted to any user's needs. It is equipped with a dual-axis servo-controlled stage to provide exceptional accuracy as well as speed and efficiency. BIO-RAD CDS 200 utilizes integrated digital signal processing (DSP) and digital image processing (DIP) to make critical dimension measurements with a resolution that exceeds industry standards. NANOMETRICS CDS 200 features a high-precision, fast-scanning digital signal processor (DSP) that allows for a large range of measurements on wafers, such as CD-SEM and CD-AFM. The DSP provides highly recombinant electrical measurement capabilities with repeatable, reliable and accurate results. CDS 200 is equipped with one of the most advanced imaging capabilities available today. It offers ultra-high resolution imaging in both real-time and post-processing modes. It also includes automated focus control and a variety of multi-sample tools to optimize results. NANOMETRICS / BIO-RAD / ACCENT CDS 200 is outfitted with a novel scientific-grade camera that has a maximum resolution of 4K and can capture color images with ultra-high resolution and superb contrast. It also features sophisticated software for analyzing and correcting images to ensure accuracy and reliability. Additionally, ACCENT CDS 200 is equipped with both a multi-angle reflectometer and an integrated multi-angle measurement machine to provide a full range of manual control over any sample measurement. BIO-RAD CDS 200 offers a range of unique capabilities that make it an ideal tool for semiconductor manufacturing. The combination of ultra-high resolution imaging and scanning, as well as highly reliable and repeatable measurements makes this tool an excellent choice for any wafer testing and metrology needs.
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