Used NANOMETRICS / BIO-RAD / ACCENT ECV Pro #9174682 for sale

NANOMETRICS / BIO-RAD / ACCENT ECV Pro is a wafer testing and metrology equipment designed to combine the best features of traditional electron microscopes with the power of today's automated metrology instruments. This system is extremely versatile and can be used for a variety of different wafer tests and applications. The tools have been designed to enhance wafer performance measurement, offering reliable yet precise results. At the core of ACCENT ECV Pro is its electron-beam imaging and analysis unit, which is capable of imaging and inspecting various surfaces including both metal and dielectric. This machine can be configured for both top-down and side-view imaging with a resolution of 25nm. The front-end optical assembly of BIO-RAD ECV Pro also includes components such as in-situ focusing and stage control that allow for the acquisition of high-fidelity images. ECV Pro also includes many other features designed to improve the accuracy of the wafer tests. The tool contains a particle detection and analysis module. This module is designed to detect particles as small as 2nm in size. The module also contains a library of pre-defined particles that can be used to reliably identify particles on the wafer's surface. NANOMETRICS ECV Pro also includes a statistical analysis and reporting software package. This package is designed to automate the process of generating reports from the data collected by the asset. The package also allows the user to customize the reports to include only the data that is most relevant to their application. The package also includes templates that can be used to automate the process of generating accurate, consistent reports. Finally, NANOMETRICS / BIO-RAD / ACCENT ECV Pro contains an extremely sophisticated defect detection module. This module is designed to identify a range of different kinds of defects such as missing, shifted, and misoriented features. The model also includes a library of pre-defined defect signature templates that allow the user to quickly and accurately identify defects. In summary, ACCENT ECV Pro is an extremely versatile and powerful wafer testing and metrology equipment. Its combination of electron beam imaging, particle detection, statistical analysis, and defect detection make it an ideal tool for a variety of wafer tests, from production inspection to failure analysis.