Used NANOMETRICS / BIO-RAD / ACCENT PN 4400 #293649897 for sale

NANOMETRICS / BIO-RAD / ACCENT PN 4400 is an advanced wafer testing and metrology equipment designed to provide precise and reliable characterization of multiple microelectronic topography standards. The system consists of a software- driven microscope and a patented contact profilometer to accurately measure the shape and characteristics of the surface of wafers with extreme accuracy. ACCENT PN 4400 unit is configured with a proprietary profilometer design and a high-resolution microscope objective. The profilometer, which is mounted directly on the microscope objective, collects precise X-Y coordinates of the wafer surface. This machine generates an exact 3D map, showing the exact curvature of the surface and other features. Microscopic features can be viewed at a magnification of up to 1000X, allowing for higher resolution and accuracy measurements. BIO-RAD PN 4400 can accurately measure various parameters, such as wafer thickness and flatness. Additionally, multiple pattern sizes and pitches can effectively be evaluated for any angularity, step heights, and feature geometries. The tool also measures profile sharpness and slope as well as defects on the surface of the wafer. The asset offers excellent coverage and repeatability over a wide range of wafer sizes and power requirements. To ensure the highest performance, the software-driven model incorporates a three-stage image-tracking algorithm that enhances calibration and repeatability of scan results. NANOMETRICS PN 4400 also has an intuitive graphical user interface (GUI), allowing the user to quickly customize their measurements and achieve excellent results. The equipment is also capabable of data logging and printing reports, helping researchers and engineers to properly document their results. In summary, PN 4400 is a powerful and reliable wafer testing and metrology system that provides precise and accurate measurements of multiple microelectronic topography standards. It incorporates a three-stage image-tracking algorithm, intuitive GUI, and multiple power requirements to help users achieve excellent results. NANOMETRICS / BIO-RAD / ACCENT PN 4400 is designed to maximize repeatability, giving researchers and engineers an effective tool to properly characterise the surface of their wafers.