Used NANOMETRICS / BIO-RAD / ACCENT Q7 #9151457 for sale

ID: 9151457
Overlay metrology system.
NANOMETRICS / BIO-RAD / ACCENT Q7 is a high performance, high-speed wafer testing and metrology equipment. It is designed for testing and characterization of nano- and microscale semiconductor devices and structures. The system offers unparalleled levels of repeatability and accuracy with its full array of tools, including optical imaging, scanning tunneling microscopy (STM), force mapping, atomic force microscopy (AFM), X-ray diffraction (XRD), ellipsometry, and magnetometry. ACCENT Q7 makes use of two quartz crystal resonators and two optical detectors that detect the resonance of the quartz crystals. With a single pass, the unit can measure up to 16 samples at the same time, each with a resolution of 0.1 nm. This allows for faster and more accurate testing and characterization. The machine also offers a range of advanced features, including high-speed imaging with a frame rate of 100,000fps, enhanced sensitivity with integrated image registration, nonlinear force mapping, and the ability to detect and measure nanostructures in brightfield, darkfield, and reflected/transmitted light imaging. BIO-RAD Q7 offers multiple advantages over conventional wafer testing and metrology systems. It is capable of providing accurate and precise measurements of the electrical, magnetic, and mechanical properties of nano- and microscale semiconductor structures. Additionally, its high-speed imaging capabilities allow for faster qualification and defect analysis. With its complete suite of tools and capabilities, NANOMETRICS Q7 is an ideal solution for any semiconductor device manufacturing process. It is capable of providing detailed and precise testing and characterization data at a high speed and accuracy, which ensures product quality and reliability.
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