Used NANOMETRICS / BIO-RAD / ACCENT Universal Hood II #293659970 for sale

NANOMETRICS / BIO-RAD / ACCENT Universal Hood II is a wafer testing and metrology equipment designed for precise automated measurements and analysis of wafer level testing. The system uses a highly precise optical stage to move the wafer across the microscope objective and image it using the latest frame transfer technology. The unit includes three linear micromotors and two joysticks to precisely adjust the position of the wafer, enabling easy switching and alignment of samples. ACCENT Universal Hood II has an integrated film metrology machine for precise optical and chemical analysis. Advanced image analysis techniques enable the operator to characterize nanometric features. The tool also includes noise management and signal-to-noise ratio optimization for improved accuracy. Additionally, the user can adjust the imaging parameters such as exposure time and light intensity for precise measurements. BIO-RAD Universal Hood II is capable of measuring thick and thin films up to 45 μm with a maximum thickness resolution of 0.01 µm. It can measure films from 1 nm to 500 nm wide with a maximum width resolution of 0.2 nm. It can also measure feature sizes up to a magnification of 1000 X. The user can configure the asset to measure different film thickness levels such as under-etch, over-etch, etch-stop and etch-end. The model also includes a closed-loop feedback equipment, which allows for automatic wafer positioning. This eliminates the need for manual adjustments during measurement, making it more efficient and accurate. The system has real-time control of focus, illumination and scan rates which enable rapid measurements. The unit accuracy is certified by a qualified metrology house for advanced laboratory use. The machine can also be used for advanced film measurements such as composition, stress, and topology. The software incorporates advanced pattern recognition algorithms that help identify, classify and analyze features and patterns in two and three-dimensional samples. The software also includes calibration of wafer features for accurate measurements. Universal Hood II provides a reliable and repeatable platform for wafer level testing and metrology for both industrial and research institutions. Its combination of easy operation and precise measurements make it an ideal instrument for high-precision analysis.