Used NANOMETRICS LYNX #9384481 for sale

NANOMETRICS LYNX is a state-of-the-art wafer testing and metrology equipment designed to support the full range of modern semiconductor device and circuit characterization. It provides comprehensive and accurate analysis of a wide variety of device and circuit parameters by offering an assortment of automated test routines and a variety of specialized test methods. The system combines the highest levels of automation, statistical control, and process control from its intelligence unit, providing a powerful platform specifically designed to measure, analyze, and control critical device parameters. LYNX offers several key features to help users get the most out of their device and circuit measurements. It supports a wide range of electrical and physical test parameters including but not limited to device parameters such as current, voltage, capacitance, resistance, breakdown voltage, leakage current, and time dependent dielectric breakdown measurements. NANOMETRICS LYNX also supports the characterization of device reliability by providing automated stress tests as well as the ability to measure performance during accelerated lifetime testing. To improve the accuracy of its measurements, LYNX uses advanced cross correlation analysis to correlate different test readings. Users can also configure devices or circuits with complex parameters when necessary to measure their day-to-day operation or capture performance over time. Features such as trend analysis, time stamping, data recording, parameter optimization, and gate and modulation characterization provide additional insights into device and circuit performance. The intuitive graphical user interface of NANOMETRICS LYNX allows users to create custom test plans and automatically execute them on a large number of devices. It also provides a wide variety of data management tools to ensure that results can be monitored, sorted, and compared easily. Furthermore, LYNX features a robust set of communication protocols that allows users to easily transfer and interpret data from their testing machine. Overall, NANOMETRICS LYNX is a robust and reliable wafer testing and metrology tool that allows users to simplify highly complex tests in order to gain precise and reliable data. Its automated test routines, specialized testing methods, advanced cross correlation analysis, intuitive graphical user interface, and robust data management capabilities provide valuable insights into device and circuit performance. The asset is the ideal choice for advanced research and development labs and production environments that require efficient and reliable testing across a broad range of applications.