Used NANOVEA ST500 #293633984 for sale

NANOVEA ST500 is a wafer testing and metrology equipment designed to measure the mechanical properties of wafers. The system is based on NANOVEA Dynamic Mechanical Analyzer (DMA) technology, which uses nano-indentation to indent a sample and then measure the force-displacement responses. The unit also utilizes a high-resolution optical profilometer to measure surface topography. This general-purpose wafer test and metrology solution offers a wide range of sample testing capabilities in one comprehensive package. ST500 offers the ability to quickly perform multiple test scenarios on a single wafer. It is able to precisely measure sample thickness, profile, topography, and other features. An automated multistage testing process allows for rapid and repeatable results generation. The machine is also equipped with an advanced image processing tool that offers a highly accurate and reliable method for test data evaluation. NANOVEA ST500 utilizes state-of-the-art technology for maximum measurement accuracy. It features an advanced digital camera for capturing images at a high resolution, and an automated precision alignment asset for positioning the sample accurately. The model is also equipped with a force and displacement sensing equipment for accurate measurements, and high-resolution laser cameras for topography measurement. ST500 is designed to meet the needs of a variety of industries, including semiconductor, aerospace, medical, and biotechnology. The system is fully customizable to meet the specific needs of each user. The user-friendly design, with intuitive graphical interface, is extremely versatile, which makes it easy to use. Overall, NANOVEA ST500 is a powerful yet versatile wafer testing and metrology unit that provides accurate and reliable measurements for a wide range of applications. The machine offers reliable and repeatable results, and is easily customizable for different user needs. Its broad range of features and capabilities make it an ideal tool for wafer testing and metrology.