Used NIKON AM-601D #9224306 for sale
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NIKON AM-601D is an automated wafer testing and metrology equipment designed to provide accurate and repeatable measurements of flat and patterned wafers with minimum operator intervention. The system is capable of measuring wafers up to 6 inches in diameter and utilizes a scanning electron microscope (SEM) to provide high-resolution images of the wafer surface. The integrated measuring unit is composed of multiple modules, including a stage and stage motion module, inspection software module, sample holder detection module, analysis software module, and web interface module. The stage and stage motion module control the movement of the wafer for precise positioning and scanning. The inspection software module then takes measurements of the wafer surface and data manipulation with optional editing capabilities. The sample holder detection module enables automated sample loading and detection of samples. The analysis software module displays the images and 3D tree map and provides wafer level insights such as fault location, roughness, topography, and layer thickness. The web interface module also provides an intuitive control interface for management of the machine. NIKON AM 601D offers a full suite of wafer testing and metrology features, including precision pressure transducers, laser interferometers, manual sample holders, and other components for testing wafer flatness and surface roughness. Additionally, the tool provides traceability and customization capabilities for performing a variety of application-specific tests. Other features of the asset include multi-tasking capability, flexible automation and precise alignment accuracy. Overall, AM-601D is a reliable, high resolution wafer testing and metrology model that is well suited for performing a range of wafer testing and measurement tasks. It offers a wide array of features and tools that allow users to quickly and accurately measure flat and patterned wafers for a variety of applications.
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