Used NIKON FX-501D2 #9412240 for sale

ID: 9412240
Reticle inspection system.
NIKON FX-501D2 is a powerful and advanced wafer testing and metrology equipment. It is designed for quick, efficient, and accurate wafer measurement and barcode recognition. The system offers a host of features, including a high-resolution 2D image sensor for fast wafer scanning, high-precision barcode recognition, dual-camera unit for simultaneous 2D and 3D scanning, and a large screen for optimal visibility. The machine can also be used for a wide range of measurements, such as die size, warpage, surface defects, thickness, and more. FX-501D2 offers an unparalleled level of speed, accuracy, and flexibility. The high-resolution 2D image sensor enables fast and accurate wafer scanning, with data acquisition speed of up to 30 wafers per minute. The dual-camera tool adds an extra layer of accuracy and speed, allowing users to accurately measure 3D characteristics such as shape, size, and burr. The large LCD screen allows easy viewing of results and image data, while the ergonomic design ensures that the operator can focus on the task at hand with optimal efficiency. In addition, NIKON FX-501D2 also features barcode recognition, which allows quick and efficient data identification. The asset is able to recognize multiple types of barcodes, including 1D and 2D Barcodes, and can also read labels from a variety of materials, including paper, plastic, and metal. This eliminates the need for manual data entry, saving time and effort. The model also features an optional robotic arm and tray loader, allowing users to perform multiple wafer tests without manual intervention. Overall, FX-501D2 is an excellent wafer testing and metrology equipment. It offers high speed, accuracy, and flexibility, along with a range of features that make it ideal for a variety of applications. With its user-friendly design and powerful capabilities, NIKON FX-501D2 is sure to become a favorite choice of manufacturers and researchers alike.
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