Used NIKON FX-501F #293620093 for sale

NIKON FX-501F Wafer Testing and Metrology Equipment is a versatile and powerful technology used in semiconductor manufacturers and laboratories across the world. This high-end technology is designed to measure, inspect, and analyze the surface and internal structures of wafers, chips, and other semiconductor components. The system combines two advanced technologies - a 2D surface measurement unit and a 3D die-to-database measurement machine - to give accurate and reliable results even with complex wafers and microchips. FX-501F uses a combination of optical filters and mirrors to accurately measure different topographical and geometrical features of microstructures. The tool can detect the small surface defects, and measure the width, length, height, and irregularities on the surface of the device. The asset also has the ability to detect any non-uniformity through a number of different methods, including differential interference contrast microscope (DICM), ellipsometric microscopic (EM), spectral peak identification (SPI) and semiconductor package inspection (CPI). The advanced 6-axis stage of the model allows for precision measurements and 3D imaging. The stage moves in all three axes and is guided by high accuracy stepper motors, offering high speed measurements with high resolution and repeatability. Additionally, NIKON FX-501F uses advanced optics, such as laser beam scanning, which increases accuracy and speed of analysis. This equipment also provides reliable testing with repeatability and automation, making it an ideal choice for challenging wafer inspection and semiconductor metrology. FX-501F also offers a number of data analysis and reporting features, making it an effective and efficient solution for wafer testing and metrology. It comes with several advanced analysis functions, such as statistical process control (SPC) analysis, six sigma analysis, automated surface recognition and classification (ASRC), and automated die to database analysis. Users can also add customized reports with real-time data, giving you maximum control over your measurement results. Overall, NIKON FX-501F Wafer Testing and Metrology System is a powerful and reliable technology used for wafer testing, inspection, and analysis. It provides highly accurate and repeatable results, as well as a wide range of data analysis and reporting features. With such advanced features, FX-501F is ideal for semiconductor manufacturers and laboratories.