Used NOVA i550 #9356921 for sale

NOVA i550 is a state of the art wafer testing and metrology product from SPTS/Oxford Instruments. The equipment is designed for advanced wafer level testing, inspection, and metrology for the semiconductor industry. It offers a range of tools and capability for optimizing the yield and performance of wafers. The system is equipped with a 150 mm interactive multi-level interface station that offers automated and intuitive loading of wafers, with manual or fully automated test strategies. It can accommodate up to 150 mm substrates with the option to adapt it to 200 mm in the future. The unit is tailored to the requirements of the customer's specific application with a range of test configurations, such as RF probes, temperature and humidity sensor, and a range of optical probes. It is also equipped with advanced optical metrology tools, such as 3D optical coherence microscopy (OCM) and photoluminescence (PL), as well as a range of photolithography and etching solutions for advanced device structures. This allows for accurate defect visualisation, measurement and characterisation of wafers up to the sub-micron level. Other features of i550 include a comprehensive software suite of wafer test tools, which enables fast data acquisition rates and data processing, enabling quick and easy identification of process and defect related areas across the wafer. This data can then be used to adjust the process as required. The machine also supports automatic test scheduling and an intuitive interface for continuous operation, allowing it to fit seamlessly into any production line. Furthermore, NOVA i550 offers advanced metrology capabilities which enable fast, reliable analysis of small and difficult to measure structures. The combination of the production-ready design, advanced test and metrology tools, intuitive user interface and wide variety of test parameters make i550 an ideal choice for advanced wafer manufacture processes and semiconductor research.