Used NOVA NovaScan 3060 #293608929 for sale

NOVA NovaScan 3060 is a wafer testing and metrology equipment designed for semiconductor manufacturers to enable efficient and accurate measurement, analysis and testing of high-precision lithography patterns. This system offers rapid measurement, a wide field of view, and a wide variety of features that enable it to perform many different testing and metrology tasks. The unit features an automated, all-in-one platform with a supported image size, large view field. The supported image format can be adjusted from bin 1:1 up to 4:1 and supports wafer sizes from 150mm to 300 mm. The machine offers powerful online real-time analysis to quickly pinpoint problem areas, identify defects, and quickly process data. The interface employs data analysis software with a variety of graphic displays and overlays to enable enhanced visualization and analysis of data. The tool can display data results in dynamic real-time images, as well as with charts, histograms, and diagrams to assist in understanding data more effectively. NovaScan 3060 utilizes advanced detection and calibration algorithms and adaptive algorithms to generate high-accuracy metrology measurements. This helps to ensure that all measurement results are consistent and accurate. The asset also includes a built-in software optimization tool which provides parameters for customization of the overall measurement process. The model also features an advanced on-chip calibration software package, which uses a special calibration pattern to accurately and rapidly determine the correct exposure parameters. The equipment can use this information to generate wafer-level topography measurements, allowing for faster and more accurate wafer-level pattern recognition testing. The system's built-in wafer-level inspection and recognition capabilities are used to detect and identify any possible defects. The unit can also store and retrieve these information for reporting and analysis. Overall, NOVA NovaScan 3060 is an easy to use, efficient and powerful tool for performing time-consuming and mission-critical metrology and testing tasks. With its robust feature set and accurate results, this machine allows wafer manufacturers to increase throughput and reduce errors during the production process.