Used NOVA NovaScan 3090 Next SA #293638911 for sale

NOVA NovaScan 3090 Next SA is a wafer testing and metrology equipment from NOVA Technologies. This system is designed to provide efficient and accurate testing of semiconductor wafers with the ability to perform multiple techniques. It offers the capability to simultaneously test different regions of a single wafer along with full wafer or die-level testing. Using a combination of hardware and software, NOVA NovaScan 3090 is able to measure wafer-level parameters such as sheet resistance and doping concentrations. It also provides integrated measurement functions for mobility of electrons and holes, local interface states, and other specific parameters. Additionally, the unit offers direct imaging and full-field passive capacitance measurements. The machine is modular and has the flexibility to be configured according to the specific metrology requirements of each user. It supports multiple station types, including an automated prober, and can be upgraded with different hardware options. Additionally, the tool can be upgraded with specialized software that expands its CMP, patterning, and device characterization capabilities. NOVA NovaScan 3090 features full wafer mapping that provides the most accurate measurement of wafer characteristics. It also has three levels of image optimization that enable a better analysis of the wafer's topography. Lastly, a MultiStation process chamber provides up to 5 ammonia-based post-metrology processes, allowing the user to perform multiple cleaning operations and annealing processes in the same asset. NOVA NovaScan 3090 is an updated, advanced model that provides robust, reliable, and accurate metrology solutions to meet the demanding requirements of semiconductor manufacturers and research centers. This equipment is ideally suited for both routine and specialized metrology applications, giving users the tools they need to measure and analyze the properties of wafers and devices quickly and accurately.