Used NOVA NovaScan 3090 Next SA #293644721 for sale

NOVA NovaScan 3090 Next SA is an advanced wafer testing and metrology equipment designed to provide precise analysis of wafer properties and features. This system utilizes a 5-axis measuring head and a high-resolution, long-working-distance zoom microscope with superior stability, allowing for measurements of up to 1/50,000th of a nanometer in all 5 axes. The modular design of this unit allows for versatility in sample handling, with a vast range of options, including vacuum and rough cutting stations and fluid transport systems. NOVA NOVASCAN 3090 NEXTSA offers unparalleled analysis capabilities, thanks to sophisticated vision software that comes with powerful features such as image analysis, color recognition, edge detection, and pattern recognition. This technology allows for a wide range of inspection criteria to be met and ensures maximum accuracy and precision. The machine can also interface with external metrology systems, such as interferometers and stylus profilers, as well as be customized with a range of options including coordinate measure device (CMM), multi-axis stages, and advanced vision options. NovaScan 3090 Next SA is designed to meet the rigorous requirements of the semiconductor and electronics industries, offering maximum reliability, reproducibility, and accuracy. The tool integrates high-precision hardware with innovative software, allowing for increased speed and improved accuracy within a compact size. It features an intuitive, user-friendly interface with real-time data analysis and reporting tools and a range of fully-customizable parameters that can be tailored to unique applications. In addition to its outstanding performance, NOVASCAN 3090 NEXTSA offers superior flexibility, as it can be adapted in a wide range of environments, including R&D, engineering, product development, quality control, and production. Its modular design also allows for rapid changes and upgrades, making NOVA NovaScan 3090 Next SA a truly universal solution to wafer testing and analysis needs.