Used NOVA NovaScan 3090 Next SA #293761312 for sale

NOVA NovaScan 3090 Next SA is a wafer testing and metrology equipment built for large-scale production in the semiconductor industry. It is designed with the aim of optimizing total throughput and throughput per data point to maximize the efficiency of the testing process. The system utilizes advanced scanning technology, including surface profile sampling and automated sample analysis to provide highly accurate results. It covers a range of substrates, including silicon, compound semiconductor and metal oxide. The wafer can contain a range of sizes, from 200mm to 8". NOVA NOVASCAN 3090 NEXTSA offers multiple scanning speeds, allowing for large-scale production. A high-speed XY scanner provides nanometer-accuracy of the sample surface, while a faster direct-read XY scan is incorporated for ummetrical surface profile measurement and consistent automated sample analysis. To ensure accuracy and speed, the built-in calibration module increases production reliability and allows for quick data analysis. Advanced motion control and stitching systems, as well as optimized software, allow for proper motion control during scanning. In addition, its user-friendly interface utilizes large color touchscreen controls and automatically generates reports with numeric data with histograms, scatter plots and timestamps. Furthermore, NovaScan 3090 Next SA also incorporates specialized software and hardware to measure and evaluate wafer topography. The unit utilizes a constant UV laser with an impressive shining distance of up to 20 meters, allowing for high-precision ridge-width measurement and automated image analysis. Overall, NOVASCAN 3090 NEXTSA is a high-precision wafer testing and metrology machine that is designed to maximize productivity and process efficiency for large-scale semiconductor production. Its advanced scanning and analysis technologies enable highly accurate and speedy results.