Used NOVA NovaScan 3090 Next SA #9233450 for sale

NOVA NovaScan 3090 Next SA is a powerful wafer testing and metrology tool designed for the demanding process control requirements of next generation semiconductor wafer fabrication. The equipment is equipped with a full-featured software platform, delivering outstanding accuracy and repeatability to ensure consistent process control from wafer start to wafer finish. NOVA NOVASCAN 3090 NEXTSA uses powerful laser scanners for top-down and bottom-up inspection. This helps to quickly identify potential defects on the wafer with minimal time and cost input. This laser-based detection ensures that even smaller defective particles can be detected during the inspection process, which helps to reduce yield losses associated with potential wafer fabrication defects. NovaScan 3090 Next SA also supports the scanning of a wide range of different wafer sizes and shapes, including 200mm, 300mm, 500mm and larger. The system can be programmed to automatically detect the wafer size and shape, and then scan the surface area or areas of interest. This helps to ensure that all areas of the wafer are thoroughly inspected for potential defects. The software platform used by NOVASCAN 3090 NEXTSA supports a wide range of metrology applications, including defect and contamination detection, defect severity grading, line width measurements, overlay measurements, and critical-dimension (CD) measurements. The software is capable of collecting, analyzing, and storing data from multiple wafer inspection runs for quality assurance (QA) purposes. NOVA NovaScan 3090 Next SA can also be equipped with high-precision optical microscopes designed for accurate CD measurements. This helps to ensure that the device can measure features with extreme accuracy, down to the submicron level. In terms of physical design, NOVA NOVASCAN 3090 NEXTSA is also compact, efficient and ergonomic. The unit occupies minimal floor space and is designed to be as user-friendly as possible, allowing operators to quickly and accurately perform various testing and metrology tasks. Overall, NovaScan 3090 Next SA is an advanced wafer testing and metrology device that provides reliable process control to help ensure the production of the highest quality semiconductor products. The device offers powerful laser scanning capabilities, a versatile software platform, and high-precision optical microscopes for CD measurements, allowing it to accurately detect even the smallest potential defects. The machine's ergonomic design and efficient floorPlan also helps to maximize productivity in the wafer inspection process.