Used NOVA NovaScan 3090 Next #293654378 for sale

NOVA NovaScan 3090 Next Wafer Metrology Equipment is a high resolution, precision automated system designed to precisely measure, analyze and inspect semiconductor integrated circuit chips, or wafers, quickly and accurately. This unit is capable of quickly and accurately testing up to 4" and 6" wafers and provides a range of options including automated tilt series and bi-directional scanning. NovaScan 3090 Next utilizes an advanced optical microscopy machine with a 14-position automated wafer slide handler. This allows for rapid tests that measure a range of features including critical dimension and overlay, wafer contour and flatness, average roughness and micro-defects. This tool provides excellent flexibility for integration with a range of automated systems, allowing for easy and complete management of the entire testing and inspection cycle. This asset is built around an innovative precision microscope that provides an extremely high level of resolution and accuracy. The superior optics model provides maximum optical performance and consistently accurate readings regardless of position within the microscope or the surface of the chip. This is supported by automatic image acquisition, which serves to further ensure accuracy and reliability. In addition, NOVA NovaScan 3090 Next is designed to meet the high-level needs of wafer testing and metrology. This equipment provides highly sophisticated image processing capabilities and automated control for data acquisition, analysis and reporting. The software includes a wide range of options for customizing the system to meet the needs of specific applications, enabling data analysis and reporting of various factors. This data can be used to develop a high-quality metrology solution that is tailored to the exact requirements of the application. NovaScan 3090 Next Wafer Metrology Unit is an advanced and high-performance machine that provides a high level of accuracy and precision testing, analysis and inspection. This tool is designed to meet the demanding needs of precision wafer testing and metrology, and is ideal for a wide range of applications.