Used NOVA NovaScan 3090 Next #293778026 for sale

NOVA NovaScan 3090 Next is a state-of-the-art wafer testing and metrology equipment designed to automate the collection of process data points with high precision, accuracy and repeatability. This system is equipped with a unique wafer navigation and alignment unit, allowing for precise control of the wafer positions and measurements. The machine's built-in calibration calibrates itself for consistent performance, with no operator intervention. This machine also employs an automated wafer localization tool to provide accurate and fast data collection. NovaScan 3090 Next is equipped with a high-resolution, multi-channel CCD camera which uses image processing to enable over-the-edge and side-view analysis of the wafer's structure and topography. It also has a high-quality optical microscope which can measure diameters, heights, angles, sidewall angles, critical dimensions, deep trench, and radial sidewall profiles, as well as areas of residual slope on the wafer. In addition, this model has a CCD image projector and an automated glass inspection and inspection asset. This model is equipped with 12 motorised directions of registration, while the optional motorised glass inspection equipment provides fast, accurate glass measurements. The system has advanced motion control which allows fast scan speeds with precise motion control to make wafer testing and metrology more efficient. NOVA NovaScan 3090 Next is the ideal tool for various wafer metrology applications such as process control, systematic failure analysis, yield improvement and defect detection. The intuitive graphical user interface and intuitive workflow enable operators of all levels to use the unit quickly and effectively. In addition, all operations are traceable through a comprehensive audit trail which enables users to monitor and trace process data. NovaScan 3090 Next is the perfect tool for a laboratory or industrial environment using wafer testing and metrology. With its intuitive user interface, powerful features and advanced motion control, this machine enables efficient and accurate wafer testing and metrology.