Used NOVA NovaScan 3090 #9228371 for sale

NOVA NovaScan 3090 is a complex and specialized wafer testing and metrology equipment, designed to provide users with accurate and reliable measurements of the critical dimensions of their semiconductor wafers. The 3090 is an automated system, capable of quickly and reliably analyzing a variety of wafers, including silicon-on-insulator (SiOI) substrates and other advanced materials. This unit utilizes non-contact eddy current and capacitance displacement sensors to measure the physical features of a wafer with a high degree of accuracy. This sensor machine is based on an inverted optical profilometer and has a precision of 30 nanometers in the x-axis direction and up to 1 micron in the y-axis direction. NovaScan 3090 is designed to quickly detect and analyze defects, as well as to accurately measure the physical dimension of the wafer. NOVA NovaScan 3090 utilizes a software package that enables users to easily configure the tool for their specific wafer and technology requirements. The software package also allows users to set measurement criteria, process data files, and produce detailed analysis reports. In addition, the software package can be programmed to assist in the development of automated testing and defect inspection routines. NovaScan 3090 is equipped with a variety of tools that enhance its performance. It features both a manual and an automated stage asset, as well as advanced pattern recognition software. With these tools, the model is able to assess the defectivity of various wafers quickly and efficiently. The automated stage equipment, for example, allows it to rapidly acquire multiple prints at various angles or depths. NOVA NovaScan 3090 is a versatile and powerful wafer testing and metrology system. It features a variety of sophisticated tools that enable users to accurately and reliably measure the physical characteristics of their wafers. By utilizing advanced pattern recognition software and automated stage systems, this unit provides users the capability to quickly and accurately detect and analyze defects, as well as measure the physical dimensions of their wafers. The machine's ease of use and highly accurate measurements make it an ideal choice for any application involving wafer testing and metrology.