Used NOVA T600 #293641029 for sale

NOVA T600 is a wafer testing and metrology equipment designed for a range of advanced wafer requirements. This integrated system utilizes advanced metrology, an automated robot arm, testing software, and optical measurement instruments to allow operators to quickly and accurately measure and analyze wafer properties. The unit works with a wide range of wafer geometry, including standard rectangular wafers and complex shaped wafers. With its dynamic parameter adjustability and customization options, T600 ensures that the properties of each wafer are accurately and precisely measured with repeatable results. NOVA T600 integrates advanced PC-based control software allowing the machine to be programmed for a variety of wafer measurements, including resistance, capacitance, dielectric permittivity, critical dimension, adhesion, and more. The tool also provides real-time data on wafers that can be used for optimization, process development, and quality control. The asset's optical measurement instruments specialize in measuring vertical and horizontal distance resolution down to 1 micrometer, which is ideal for transferring BGA (ball grid array) designs to wafer surfaces. An automated robot arm provides fast and precise movement of the wafers, at the same time orienting them relative to the optical instruments. T600's design enables operators to monitor the entire testing process from a single location. Through a built-in Ethernet connection, operators can monitor and control the model at any time from any location. In addition to wafer testing, the equipment also offers the option of on-wafer inspection of intermediate stages of a production run. Overall, NOVA T600 offers advanced finished wafer testing with fast measurement times and repeatable results. Its automated operation, intuitive software, and versatile optical instruments enable operators to quickly and accurately analyze wafer properties. With its versatile capabilities and versatile design, T600 is an ideal choice for wafer metrology and test applications.