Used NOVA V2600 #9233453 for sale

NOVA V2600 Wafer Testing and Metrology Equipment is a high precision, automated wafer testing and metrology measuring system designed to provide reliable, accurate and repeatable results. It integrates high-resolution optical microscopy with the very latest in automated inspection and defect recognition software, providing an efficient and cost-effective wireless imaging solution. V2600 can accurately measure the uniformity and thickness of a range of wafer materials including silicon, glass andceramics. NOVA V2600 utilizes contact image sensing (CIS), laser scanning, and scanning electron microscope (SEM) technologies in order to accurately inspect and analyze the surface of a wafer. This type of metrology is beneficial in applications such as defect recognition, virtual mapping, and the monitoring of process parameters. V2600 also features an array of automated vision systems in order to measure the surface features of wafers. These systems include automated robot wafer handlers, edge-detection systems, and a variety of patented illumination techniques. NOVA V2600 boasts an array of hardware features, including 4-axis scanning capabilities, high-resolution optical microscopy with up to 500x magnification, a fully integrated vision unit, and precise wafer positioning accuracy throughout a full range of linear and angular movements. Additionally, the machine can support samples up to 12 inches and delivers real-time feedback and reporting of results. Other key features of V2600 include spatial mapping, 2D and 3D mapping of defects, stage adjustment for changing wafer positioning, and real-time tracking of process parameters. This tool is ideal for wafer inspection, metrology, and process control applications as it can measure die-to-die variations, direct defect recognition, and reduce yield losses associated with particle contamination. Furthermore, defective wafers can be recalled from the inspection process and reworked, ensuring full process control and optimal product quality. NOVA V2600 Wafer Testing and Metrology Asset is an advanced and reliable model for achieving precise and repeatable wafer testing and metrology measurements. It offers a cost-efficient and accurate way to achieve reliable and repeatable results across a range of materials. Its comprehensive array of hardware and software features allows for precise and repeatable wafer testing and metrology measurements, reducing yield losses and improving product reliability.