Used NOVA V2600 #9397357 for sale

NOVA V2600 is a high-end wafer testing and metrology equipment designed for advanced semiconductor fabrication and fabrication-distribution lines. It is capable of performing all types of test and metrology tasks such as scanning electrical test, optical test, defect-masking and inspection, die shear and package pull tests, and optical and particle characterization. The system consists of two modules - the Optical and Electrical Test Station (OETS) and the Metrology Station (MS). The OETS consists of a modular optical and electrical testing station, which uses an automated robotic arm to perform wafer-level test operations. The unit supports both 2D and 3D metrology and electrical measurements and can be used to quickly and accurately measure parameters such as dopant concentration, defect and impurity density, device yield, and other critical process-related parameters. The Metrology Station houses a range of metrology and imaging instruments such as scanning electron microscopes (SEMs), atomic force microscopes (AFMs), and confocal laser microscopes (CLMs). It also contains a variety of spectroscopic instruments including Fourier transform infrared spectrometers (FTIRs), x-ray photoelectron spectrometers (XPSs), and Raman spectrometers. These instruments are used to measure wafer-level Metrology and Imaging parameters including etch depth, density, topography, interface angle, surface roughness, and other critical process variables. V2600 includes a range of automatic features, such as automated data acquisition and analysis, enabling users to quickly and accurately analyze data. The machine is able to integrate with other software such as Statistical Process Control (SPC) packages and other computer-aided design and manufacturing (CAD/CAM) software. Through its advanced data analysis and reporting capabilities, it provides advanced decision-making support for process improvement and optimization. In terms of safety, the tool is designed to meet the safety standards of the semiconductor industry, with multiple layers of safety detection including additional interlocks and a verified built-in safety function. These features ensure that the asset will not be activated in the presence of a hazardous environment and that it can be operated safely in a production environment. Overall, NOVA V2600 is a powerful and reliable wafer testing and metrology model that provides a comprehensive solution for advanced semiconductor manufacturing. Its advanced systems and features enable users to quickly and accurately analyze data, identify defects, optimize processes, and improve quality. Furthermore, its safety features ensure that it can be used in a safe and efficient manner.