Used NOVASCAN 210 #9224124 for sale

NOVASCAN 210 is an advanced wafer testing and metrology equipment designed for high precision surface analysis, defect inspection and dimensional measurements of wafer samples. It features a variety of sensors suited for surface imaging and various other processes, such as Laser Scanning Microscopy (LSM), Photon Scanning Microscopy (PSM), Electron Beam Microscopy (EBM) and Atomic Force Microscopy (AFM). The system also contains Automated Defect Detection (ADD) software, enabling in-depth characterization of small defects and uniformity measurement. With energy-dispersive X-ray (EDX) capabilities, 210 can measure elemental composition and performs chemical identification of defects or impurities in materials. The unit is based on an optical platform with a large area digital camera, sensitive optics and a motorized gantry mounting machine. Capable of ultra high-resolution imaging of large-sized wafers and samples, NOVASCAN 210 also has an integrated sample positioning stage, allowing for fast and accurate adjustment of the sample's position. The machine's few components, its large working area, fast alignment and field flattening techniques all make it an ideal choice for production support. The software package also includes high speed scanning and visualization, basic pattern recognition and advanced comparison tools. Overall, 210 is an ideal solution for a wide range of wafer testing and metrology applications, and is designed to provide reliable and accurate measurements in a fast and easy-to-use package. It is ideal for a variety of processes and applications, including failure analysis, process monitoring, wafer lithography, parametric testing, quality control and others.