Used NOVASCAN 210 #9284368 for sale

NOVASCAN 210 is a wafer testing and metrology equipment designed for wafer-level testing and inspection of integrated circuits. The system utilizes a focused ion beam gun to map topography of each wafer surface in order to determine electrical and physical characteristics of individual components. The unit consists of a high vacuum chamber, a computer machine, an ion source, a set of lenses, an imaging tool, and a beam deflector. The vacuum chamber is made of high quality stainless steel and is designed to provide a vacuum environment for the structure and components inside. The computer asset controls all components and records data from the instrument. The ion source contains one or more charged particles, such as xenon, argon, or helium, which are focused by the lenses and directed through the beam deflector. The imaging model records the size and location of the components on the wafer, and uses the resulting information to determine the electrical and physical characteristics of the components on the wafer. The equipment has a variety of applications, including the identification and location of defective components, failure analysis, and defect analysis. It can also be used to identify short circuit paths, diagnose and correct gate oxide failure, measure dielectric constant, and measure depletion layer and channel current leakage. The system is also useful for assessing the influence of processes on a wafer or component, such as thermal and electrical stress, dielectric isolation, and electrostatically induced charge. The unit is applicable to a variety of wafers and components, such as GaAs, silicon, SiGe, and SOI. The machine can be used to measure nanoscale features and surface topography of components with nanometer accuracy, allowing for a high degree of control. The tool is also capable of measuring a wide range of electrical parameters with high accuracy, such as threshold voltage, access and turn-on voltage, and sub-micron gate lengths. 210 is an advanced wafer testing and metrology asset, offering the user a wide range of features and applications. It is an ideal tool for testing and inspecting integrated circuits, providing a reliable and accurate way to determine electrical and physical characteristics of individual components.