Used NOVASCAN 420 #9282488 for sale

NOVASCAN 420 is a state-of-the-art wafer testing and metrology equipment designed to provide accurate and reliable measurements for advanced wafer materials and products. It is designed to inspect, analyze and report on the performance of microstructures on wafer surfaces. This system is capable of measuring physical parameters such as flatness, warp, plate thickness, peak-to-valley, bow, stress and stress birefringence. 420 is an automated optical metrology unit, offering a holistic approach to wafer testing and metrology. The on-board diamond-turning machines feature high-accuracy non-contact measurement of wafer surfaces, using multimodal intelligent 3D imaging of the target surface. The 3D imaging technology allows for the rapid detection and instant analysis of surface-type and structured-structure information, which can be used to diagnose potential defects like particles, scratches, Warpage, etc. Furthermore, NOVASCAN 420 is equipped with advanced machine learning algorithms and computer vision processing, which enable it to detect and detect defects and defects in real-time. Advanced parameterization techniques and edge detection algorithms are used to provide detailed analysis of wafer characteristics. These features allow for the rapid determination of material properties, such as refractive index, optical properties and surface composition. Also, the machine can be used to measure parameters such as surface morphology, topography, profile, and line width. This machine can also be used for thickness profiles of up to 10um/mm, with line width resolutions up to 60nm. In addition to these features, 420 also offers a robust suite of analysis tools that support statistical analysis of the measurement data. Theseanalysis tools include power spectral density and auto-correlation measurements,which can be used to detect long range variations in wafer surface geometry. The tool can also store up to 10,000 high resolution images of wafers in its on-board memory. Overall, NOVASCAN 420 is an advanced, multi-functional asset designed to enable accurate and reliable wafer testing and metrology. It offers an easy-to-use platform that is designed to help reduce time-to-results and improve process consistency. The comprehensive suite of powerful analysis tools and technological features makes 420 an ideal solution for research and development labs, universities, and production facilities.