Used NOVASCAN 840 #9229187 for sale

NOVASCAN 840 is a high-tech wafer testing and metrology equipment that offers a full range of capabilities for wafer testing. The system provides advanced metrology functionality, including 3D defect inspection, particle analysis, CMP (Chemical Mechanical Planarization) studies, and defect evaluation. 840 is equipped with a digital video camera and several types of light sources, making it perfect for in-line wafer inspection. It incorporates a unique X, Y, Z stage movement that is capable of scanning wafers quickly and accurately. The unit uses state-of-the-art algorithms to accurately compare the shape and size of different parts of the wafers. NOVASCAN 840 is also capable of defect analysis. It analyses defects such as contaminants, scratches, and etch pattern irregularities that may be found on wafers. This process allows for improved yield control, as well as identification of areas that require more attention. In addition, 840 is able to perform wafer-level metrology. The machine can measure parameters such as thinner than 1 micron features, line width variation, and high-resolution profiles. It is also able to detect irregular surfaces and/or excessive thickness variation. NOVASCAN 840 also offers several types of visual feedback. Its graphical user interface provides a range of ways to view and analyze data collected by the tool. This includes feature maps, as well as a split screen display mode. 840 is uniquely designed for the needs of the semiconductor industry. In particular, it is capable of accurately detecting particles that are only 3.7 µm in size. Furthermore, the asset is sensitive enough to detect a deviation from the designed wafer topography that is only 0.2 µm high. Overall, NOVASCAN 840 is a powerful and versatile wafer testing tool that can be used to keep the manufacturing process running smoothly. It can also be used to find and analyze defects in order to prevent yield losses. With its advanced metrology capabilities, it can accurately measure and visualize the shapes and sizes of various wafer parts.